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引用该论文:

BAI Shi-wu,DING Hong-sheng.The Principle and Application of Nondestructive Testing Based on DC Superconducting Quantum Interference Device[J].Nondestructive Testing,2006,28(5):242～244
白世武,丁红胜.直流超导量子干涉器无损检测的原理与应用[J].无损检测,2006,28(5):242～244

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